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Influence of temperature on the actuation voltage of RF-MEMS switchesMULLONI, V; SOLAZZI, F; FICORELLA, F et al.Microelectronics and reliability. 2013, Vol 53, Num 5, pp 706-711, issn 0026-2714, 6 p.Article

Modeling of gold microbeams as strain and pressure sensors for characterizing MEMS packagesFAES, A; RESTA, G; SOLAZZI, F et al.Microsystem technologies. 2012, Vol 18, Num 7-8, pp 1139-1145, issn 0946-7076, 7 p.Conference Paper

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